Journal of Remote Sensing Technology
Journal of Remote Sensing Technology(JRST)
ISSN:2330-1767(Print)
ISSN:2330-1775(Online)
Frequency: Annually
Website: www.bowenpublishing.com/jrst/

Editorial Board

Dr. Prashant Srivastava, University of Bristol, UK

Dr. Alain Miffre, Light and Matter Institute, France

Prof. Barry N Haack, George Mason University, USA

Prof. Andrea Benedetto, Roma Tre University, Italy

Prof. Eyal Ben-Dor, Tel-Aviv University, Israel

Dr. Chandrashekhar M. Biradar,International Center for Agricultural Research in Dry Areas (ICARDA), Jordan

Prof. Changsheng Cai, Central South University, China

Prof. C.R.Suribabu, SASTRA University, India

Prof. Wenqin Wang, University of Electronics Science & Technology of China, China

Prof. Chunhua Zhang, Algoma University, Canada

Prof. S. El-Rabaie, Menoufia University, Egypt

Prof. V. K. Srivastava, Indian School of Mines University, India

Prof. Abdelaziz Kallel, Higher Institute of Electronic and Communication of Sfax, Tunisia

Prof. M.Seetha, G. Narayanamma Institute of Technology and Sciences, India

Prof. Robert Y.Wang, Chinese Academy of Sciences, China

Associate Prof. Hao Wu, Wuhan University of Technology, China

Prof. Serwan Baban, Cihan University, Iraq

Associate Professor Ovidiu Stefan, Technical University of Cluj Napoca, Romania

Salah Bourennane, Ecole Centrale Marseille Fresnel Institute, France

Prof. Peter Bajorski, Rochester Institute of Technology, USA

Dr. Anoop Kumar Mishra, Sathyabama University, India

Associate Professor Ali Mohammadzadeh, K.N.Toosi University of Technology, Iran